[IEEE 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011 - Baltimore, MD, USA (2011.06.5-2011.06.10)] 2011 IEEE MTT-S International Microwave Symposium - Fully integrated 50 Gbit/s half-rate linear phase detector in SiGe BiCMOS
Joram, Niko, Barghouthi, Atheer, Knochenhauer, Christian, Ellinger, Frank, Scheytt, ChristophYear:
2011
Language:
english
DOI:
10.1109/MWSYM.2011.5972560
File:
PDF, 562 KB
english, 2011