[IEEE 2010 IEEE International Test Conference (ITC) -...

  • Main
  • [IEEE 2010 IEEE International Test...

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Redundant core testing on the cell BE microprocessor

Iverson, David, Dickinson, Dan, Masson, John, Newman-LaBounty, Christina, Simmons, Daniel, Tanona, William
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/TEST.2010.5699206
File:
PDF, 305 KB
english, 2010
Conversion to is in progress
Conversion to is failed