[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Redundant core testing on the cell BE microprocessor
Iverson, David, Dickinson, Dan, Masson, John, Newman-LaBounty, Christina, Simmons, Daniel, Tanona, WilliamYear:
2010
Language:
english
DOI:
10.1109/TEST.2010.5699206
File:
PDF, 305 KB
english, 2010