[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Unique adhesion testing and MSL modeling
Amagai, Masazumi, Takao, KentaroYear:
2013
Language:
english
DOI:
10.1109/ECTC.2013.6575572
File:
PDF, 1.68 MB
english, 2013