[IEEE 2009 Spanish Conference on Electron Devices (CDE) -...

  • Main
  • [IEEE 2009 Spanish Conference on...

[IEEE 2009 Spanish Conference on Electron Devices (CDE) - Santiago de Compostela, Spain (2009.02.11-2009.02.13)] 2009 Spanish Conference on Electron Devices - Analysis of the C-V characteristic in SiO2/GaN MOS capacitors

Cortes, I, Al-Alam, E, Besland, MP, Regreny, P, Morancho, F, Cazarre, A, Cordier, Y, Goullet, A, Isoird, K
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/SCED.2009.4800479
File:
PDF, 3.60 MB
english, 2009
Conversion to is in progress
Conversion to is failed