Total Ionizing Dose and Single Event Effects Hardness...

IEEE Transactions on Nuclear Science 2008 / 08 Vol. 55; Iss. 4

Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Felix, James A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2008.2001268
Date:
August, 2008
File:
PDF, 1.50 MB
english, 2008
Conversion to is in progress
Conversion to is failed