[IEEE 2009 Second International Conference on Advances in Circuits, Electronics and Micro-electronics (CENICS) - Sliema, Malta (2009.10.11-2009.10.16)] 2009 Second International Conference on Advances in Circuits, Electronics and Micro-electronics - Amplitude Analysis in Partial Discharge Measurement
Havlicek, Tomas, Haze, Jiri, Bousek, JaroslavYear:
2009
Language:
english
DOI:
10.1109/CENICS.2009.21
File:
PDF, 464 KB
english, 2009