Development of accurate on-wafer, cryogenic...

IEEE Transactions on Microwave Theory and Techniques 1996 / 7 Vol. 44; Iss. 7

Development of accurate on-wafer, cryogenic characterization techniques

Laskar, J., Bautista, J.J., Nishimoto, M., Hamai, M., Lai, R.
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Volume:
44
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/22.508659
Date:
July, 1996
File:
PDF, 613 KB
english, 1996
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