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[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Multiple Linear Regression to detect shielding effectiveness degradations
Audone, Bruno, Giunta, GergioYear:
2008
Language:
english
DOI:
10.1109/EMCEUROPE.2008.4786802
File:
PDF, 272 KB
english, 2008