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[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - New Methodology for the Characterization of EEPROM Extrinsic Behaviors
Medjahed, Djafer, Yao, Thierry, Wojciechowski, Dominique, Gassot, Pierre, Yameogo, MichaelYear:
2007
Language:
english
DOI:
10.1109/ICMTS.2007.374455
File:
PDF, 1.77 MB
english, 2007