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[IEEE Test Symposium (EWDTS) - St. Petersburg, Russia (2010.09.17-2010.09.20)] 2010 East-West Design & Test Symposium (EWDTS) - Exploring modeling and testing of NAND flash memories
Di Carlo, Stefano, Fabiano, Michele, Piazza, Roberto, Prinetto, PaoloYear:
2010
Language:
english
DOI:
10.1109/EWDTS.2010.5742059
File:
PDF, 689 KB
english, 2010