[IEEE 2014 27th International Conference on VLSI Design - India (2014.01.5-2014.01.9)] 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems - Reliability Aware Gate Sizing Combating NBTI and Oxide Breakdown
Roy, Subhendu, Pan, David Z.Year:
2014
Language:
english
DOI:
10.1109/VLSID.2014.14
File:
PDF, 340 KB
english, 2014