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[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - Turning JTAG inside out for fast extended test access
Devadze, Sergei, Jutman, Artur, Aleksejev, Igor, Ubar, RaimundYear:
2009
Language:
english
DOI:
10.1109/LATW.2009.4813799
File:
PDF, 247 KB
english, 2009