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[IEEE 12th Annual Symposium on Gallium Arsenide Integrated Circuit (GaAs IC) - New Orleans, LA, USA (7-10 Oct. 1990)] 12th Annual Symposium on Gallium Arsenide Integrated Circuit (GaAs IC) - Reliability analysis of GaAs/AlGaAs HBTs under forward current/temperature stress
Hafizi, M.E., Pawlowicz, L.M., Tran, L.T., Umemoto, D.K., Streit, D.C., Oki, A.K., Kim, M.E., Yen, K.H.Year:
1990
DOI:
10.1109/GAAS.1990.175521
File:
PDF, 272 KB
1990