![](/img/cover-not-exists.png)
[IEEE 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Nara, Japan (2013.12.15-2013.12.18)] 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models
Pues, Hugo, Brike, Ben, Gazda, Celina, Teichmann, Peter, Stijnen, Kristof, Peeters, Christian, Durier, Andre, Vande Ginste, DriesYear:
2013
Language:
english
DOI:
10.1109/EMCCompo.2013.6735209
File:
PDF, 433 KB
english, 2013