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[IEEE Comput. Soc. Press IEEE International Conference on Computer Aided Design (ICCAD) - San Jose, CA, USA (5-9 Nov. 1995)] Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) - Estimation of maximum transition counts at internal nodes in CMOS VLSI circuits

Chin-Chi Teng,, Hill, A.M., Sung-Mo Kang,
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Year:
1995
Language:
english
DOI:
10.1109/ICCAD.1995.480142
File:
PDF, 509 KB
english, 1995
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