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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Cost-effective designs of field service for electronic systems

Yu-Ting Lin,, Williams, D., Ambler, T.
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Year:
2005
Language:
english
DOI:
10.1109/TEST.2005.1584005
File:
PDF, 296 KB
english, 2005
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