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[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Electrical and physical analysis of a 28nm FPGA programmable delay circuit single tap delay failure
Meng, Chow Yew, Haonan, Bai, Tan, Grace, Salinas, Peter F, Yang, Johney OuYear:
2014
Language:
english
DOI:
10.1109/IPFA.2014.6898155
File:
PDF, 1.74 MB
english, 2014