[IEEE 2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) - Hong Kong, China (2009.12.8-2009.12.11)] 2009 IEEE International Conference on Industrial Engineering and Engineering Management - Combination of Genetic Algorithm and LP-metric to solve single machine bi-criteria scheduling problem
Aryanezhad, M.B., Jabbarzadeh, A., Zareei, A.Year:
2009
Language:
english
DOI:
10.1109/IEEM.2009.5373207
File:
PDF, 99 KB
english, 2009