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[IEEE Comput. Soc 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002 - Vancouver, BC, Canada (6-8 Nov. 2002)] 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. - Testing digital circuits with constraints
Al-Yamani, A.A., Mitra, S., McCluskey, E.J.Year:
2002
Language:
english
DOI:
10.1109/DFTVS.2002.1173516
File:
PDF, 364 KB
english, 2002