[IEEE Comput. Soc. Press 12th International Conference on Pattern Recognition - Jerusalem, Israel (9-13 Oct. 1994)] Proceedings of 12th International Conference on Pattern Recognition - Corner detection using the MAP technique
Xining Zhang,, Haralick, R.M., Ramesh, V.Volume:
1
Year:
1994
Language:
english
DOI:
10.1109/ICPR.1994.576354
File:
PDF, 351 KB
english, 1994