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[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETs
Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.Year:
1995
Language:
english
DOI:
10.1109/IPFA.1995.487601
File:
PDF, 383 KB
english, 1995