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[IEEE 2010 IEEE Students Technology Symposium (TechSym) - Kharagpur, India (2010.04.3-2010.04.4)] 2010 IEEE Students Technology Symposium (TechSym) - Statistical pattern analysis of white blood cell nuclei morphometry
Madhumala Ghosh,, Devkumar Das,, Subhodip Mandal,, Chandan Chakraborty,, Mallika Pala,, Maity, Ashok K, Pal, Surjya K, Ray, Ajoy KYear:
2010
Language:
english
DOI:
10.1109/TECHSYM.2010.5469197
File:
PDF, 2.45 MB
english, 2010