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[IEEE 46th International Symposium on Reliability and Maintainability - Product Quality and Integrity - Los Angeles, CA, USA (24-27 Jan. 2000)] Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055) - Modeling mutually exclusive events in fault trees
Twigg, D.W., Ramesh, A.V., Sandadi, U.R., Sharma, T.C.Year:
2000
Language:
english
DOI:
10.1109/RAMS.2000.816276
File:
PDF, 317 KB
english, 2000