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[IEEE Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2007.03.18-2007.03.22)] Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - Next Generation Heat Sinks for High-power Diode Laser Bars
Leers, Michael, Scholz, Christian, Boucke, Konstantin, Oudart, MyriamYear:
2007
Language:
english
DOI:
10.1109/STHERM.2007.352395
File:
PDF, 592 KB
english, 2007