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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Impact of failure criteria on electromigration of W-plug contact
Guo Qiang,, Lo Keng Foo,, Zeng Xu,, Liu Xu,, Yao Pei,, Tan Pee Ya,Year:
1999
Language:
english
DOI:
10.1109/IPFA.1999.791319
File:
PDF, 419 KB
english, 1999