Extraction of substrate parameters for RF MOSFETs based on...

IEEE Microwave and Wireless Components Letters 2005 Vol. 15; Iss. 6

Extraction of substrate parameters for RF MOSFETs based on four-port measurement

Shih-dao Wu, Guo-wei Huang, Kun-ming Chen, Chun-yen Chang, Hua-chou Tseng, Tsun-lai Hsu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
15
Year:
2005
Language:
english
DOI:
10.1109/LMWC.2005.850566
File:
PDF, 197 KB
english, 2005
Conversion to is in progress
Conversion to is failed