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[IEEE 2012 28th International Conference on Microelectronics (MIEL 2012) - Nis, Serbia (2012.05.13-2012.05.16)] 2012 28th International Conference on Microelectronics Proceedings - Low noise as a diagnostic tool for GaSb based laser diodes prepared by Molecular Beam Epitaxy
Lunak, M., Chobola, Z., Vanek, J., Hulicius, E.Year:
2012
Language:
english
DOI:
10.1109/MIEL.2012.6222870
File:
PDF, 390 KB
english, 2012