[IEEE High Density Design Packaging and Microsystem Integration, 2007 International Symposium on - (2007.06.26-2007.06.28)] High Density Design Packaging and Microsystem Integration, 2007 International Symposium on - Multi-phase Clock Scan Technique for Low Test Power
Zhang, Jinyi, Zhang, Tianbao, Zuo, QinghuaYear:
2007
Language:
english
DOI:
10.1109/HDP.2007.4283629
File:
PDF, 311 KB
english, 2007