[IEEE 2000 IEEE International SOI Conference. Proceedings -...

  • Main
  • [IEEE 2000 IEEE International SOI...

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Impact of the gate-to-body tunneling current on SOI history effect

Fung, S.K.H., Zamdmer, N., Yang, I., Sherony, M., Shih-Hsieh Lo,, Wagner, L., Chen, T.-C., Shahidi, G., Assaderaghi, F.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2000
Language:
english
DOI:
10.1109/SOI.2000.892800
File:
PDF, 152 KB
english, 2000
Conversion to is in progress
Conversion to is failed