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[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Impact of the gate-to-body tunneling current on SOI history effect
Fung, S.K.H., Zamdmer, N., Yang, I., Sherony, M., Shih-Hsieh Lo,, Wagner, L., Chen, T.-C., Shahidi, G., Assaderaghi, F.Year:
2000
Language:
english
DOI:
10.1109/SOI.2000.892800
File:
PDF, 152 KB
english, 2000