Use of secondary-electron yields determined from breakdown...

Plasma Sources Science and Technology 1999 / 11 Vol. 8; Iss. 4

Use of secondary-electron yields determined from breakdown data in cathode-fall models for Ar

Phelps, A V, Pitchford, L C, Pédoussat, C, Donkó, Z
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Volume:
8
Language:
english
Journal:
Plasma Sources Science and Technology
DOI:
10.1088/0963-0252/8/4/401
Date:
November, 1999
File:
PDF, 70 KB
english, 1999
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