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[IEEE 2005 IEEE Conference on Emerging Technologies and Factory Automation - Catania, Italy (19-22 Sept. 2005)] 2005 IEEE Conference on Emerging Technologies and Factory Automation - Process Fault Diagnosis Approach based on Neural Observers
Brito Palma, L., Vieira Coito, F., Silva, R.N.Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/etfa.2005.1612642
File:
PDF, 1.29 MB
english, 2005