Method for tight-binding parametrization: Application to...

Physical Review B 2000 / 8 Vol. 62; Iss. 8

Method for tight-binding parametrization: Application to silicon nanostructures

Niquet, Y. M., Delerue, C., Allan, G., Lannoo, M.
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Volume:
62
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.62.5109
Date:
August, 2000
File:
PDF, 138 KB
english, 2000
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