[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - A novel on-chip current-sensing structure for current-mode DC-DC converter
Hongyi Wang,, Xi Hu,, Quanfeng Liu,, Gangdong Zhao,, Dongzhe Luo,Year:
2013
Language:
english
DOI:
10.1109/vldi-dat.2013.6533871
File:
PDF, 743 KB
english, 2013