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[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - A de-embedding procedure oriented to the determination of FET intrinsic I-V characteristics from high-frequency large-signal measurements
Avolio, G., Schreurs, D., Raffo, A., Crupi, G., Vannini, G., Nauwelaers, B.Year:
2010
Language:
english
DOI:
10.1109/arftg76.2010.5700059
File:
PDF, 652 KB
english, 2010