Risk assessment on defects in GIS based on PD diagnostics

IEEE Transactions on Dielectrics and Electrical Insulation 2013 / 12 Vol. 20; Iss. 6

Risk assessment on defects in GIS based on PD diagnostics

Schichler, U., Koltunowicz, W., Endo, F., Feser, K., Giboulet, A., Girodet, A., Hama, H., Hampton, B., Kranz, H.-G., Lopez-Roldan, J., Lundgaard, L., Meijer, S., Neumann, C., Okabe, S., Pearson, J., P
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2013.6678866
Date:
December, 2013
File:
PDF, 1.09 MB
english, 2013
Conversion to is in progress
Conversion to is failed