Characterization of Interlayer Cs +...

Analytical Chemistry 2004 / 05 Vol. 76; Iss. 10

Characterization of Interlayer Cs + in Clay Samples Using Secondary Ion Mass Spectrometry with Laser Sample Modification

Groenewold, G. S., Avci, R., Karahan, C., Lefebre, K., Fox, R. V., Cortez, M. M., Gianotto, A. K., Sunner, J., Manner, W. L.
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Volume:
76
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac035400u
Date:
May, 2004
File:
PDF, 827 KB
english, 2004
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