[IEEE 2008 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Anchorage, AK, USA (2008.06.23-2008.06.28)] 2008 IEEE Conference on Computer Vision and Pattern Recognition - Simultaneous super-resolution and feature extraction for recognition of low-resolution faces
Hennings-Yeomans, Pablo H., Baker, Simon, Kumar, B.V.K. VijayaYear:
2008
Language:
english
DOI:
10.1109/cvpr.2008.4587810
File:
PDF, 1.45 MB
english, 2008