[IEEE 2011 IEEE International Electron Devices Meeting...

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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Dual gate photo-thin film transistor with high photoconductive gain for high reliability, and low noise flat panel transparent imager

Sanghun Jeon,, Seung-Eon Ahn,, Ihun Song,, Yongwoo Jeon,, Young Kim,, Sangwook Kim,, Hyunsik Choi,, Hojung Kim,, Eunha Lee,, Sungsik Lee,, Nathan, Arokia, Robertson, John, Changjung Kim,, U
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Year:
2011
Language:
english
DOI:
10.1109/iedm.2011.6131551
File:
PDF, 919 KB
english, 2011
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