Use of high lateral resolution secondary-ion mass spectrometry to characterize self-assembled monolayers on microfabricated structures
Frisbie, C. Daniel, Martin, John R., Duff, Ronald R., Wrighton, Mark S.Volume:
114
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja00044a028
Date:
August, 1992
File:
PDF, 879 KB
english, 1992