Secondary ion mass spectrometric image depth profiling for...

Analytical Chemistry 1982 / 01 Vol. 54; Iss. 1

Secondary ion mass spectrometric image depth profiling for three-dimensional elemental analysis

Patkin, Adam J., Morrison, George H.
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Volume:
54
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00238a005
Date:
January, 1982
File:
PDF, 1.83 MB
english, 1982
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