Traps localization and analysis in GaN HEMTs

Microelectronics Reliability 2014 / 09 Vol. 54; Iss. 9-10

Traps localization and analysis in GaN HEMTs

Chini, A., Soci, F., Meneghesso, G., Meneghini, M., Zanoni, E.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.085
Date:
September, 2014
File:
PDF, 1.63 MB
english, 2014
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