Atomic number correction in electron probe x-ray...

Analytical Chemistry 1984 / 12 Vol. 56; Iss. 14

Atomic number correction in electron probe x-ray microanalysis of curved samples and particles

Markowicz, Andrzej A., Van Grieken, Rene E.
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Volume:
56
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00278a036
Date:
December, 1984
File:
PDF, 505 KB
english, 1984
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