High-Resolution Lateral Differentiation Using a Macroscopic...

Journal of the American Chemical Society 2000 / 05 Vol. 122; Iss. 20

High-Resolution Lateral Differentiation Using a Macroscopic Probe:  XPS of Organic Monolayers on Composite Au−SiO 2 Surfaces

Shabtai, Keren, Rubinstein, Israel, Cohen, Sidney R., Cohen, Hagai
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Volume:
122
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja993710h
Date:
May, 2000
File:
PDF, 102 KB
english, 2000
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