Crystal Structure of La 4 Si 2 O 7 N 2 Analyzed by the Rietveld Method Using the Time-of-Flight Neutron Powder Diffraction Data
Takahashi, Junichi, Yamane, Hisanori, Hirosaki, Naoto, Yamamoto, Yoshinobu, Suehiro, Takayuki, Kamiyama, Takashi, Shimada, MasahikoVolume:
15
Language:
english
Journal:
Chemistry of Materials
DOI:
10.1021/cm020930c
Date:
March, 2003
File:
PDF, 180 KB
english, 2003