Low fraction of hexagonal inclusions in thick and bulk cubic GaN layers
Waheeda, S.N., Zainal, N., Hassan, Z., Novikov, S.V., Akimov, A.V., Kent, A.J.Volume:
317
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2014.08.186
Date:
October, 2014
File:
PDF, 1.18 MB
english, 2014