Effects of post-annealing temperature on carbon incorporated amorphous indium–zinc-oxide thin-film transistors fabrication using sputtering at room temperature
Parthiban, Shanmugam, Kwon, Jang-YeonVolume:
4
Year:
2014
Language:
english
Journal:
RSC Advances
DOI:
10.1039/c4ra01782j
File:
PDF, 871 KB
english, 2014