![](/img/cover-not-exists.png)
[IEEE 2010 43rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) - Atlanta, GA, USA (2010.12.4-2010.12.8)] 2010 43rd Annual IEEE/ACM International Symposium on Microarchitecture - Elastic Refresh: Techniques to Mitigate Refresh Penalties in High Density Memory
Stuecheli, Jeffrey, Kaseridis, Dimitris, C.Hunter, Hillery, John, Lizy K.Year:
2010
Language:
english
DOI:
10.1109/micro.2010.22
File:
PDF, 479 KB
english, 2010