Optical characterization of epitaxial single crystal CdTe thin films on Al2O3 (0001) substrates
Jovanovic, S.M., Devenyi, G.A., Jarvis, V.M., Meinander, K., Haapamaki, C.M., Kuyanov, P., Gerber, M., LaPierre, R.R., Preston, J.S.Volume:
570
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.09.027
Date:
November, 2014
File:
PDF, 502 KB
english, 2014