[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Garbage collection for multi-version index on flash memory
Lam, Kam-Yiu, Wang, Jiantao, Chang, Yuan-Hao, Hsieh, Jen-Wei, Huang, Po-Chun, Poon, Chung Keung, Zhu, Chun JiangYear:
2014
Language:
english
DOI:
10.7873/date2014.070
File:
PDF, 176 KB
english, 2014