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Atomic structure analysis of stacking faults and misfit dislocations at 3C-SiC/Si(0 0 1) interfaces by aberration-corrected transmission electron microscopy
Yamasaki, J, Inamoto, S, Nomura, Y, Tamaki, H, Tanaka, NVolume:
45
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/45/49/494002
Date:
December, 2012
File:
PDF, 3.49 MB
english, 2012